Employing transistor reliability testing as an FA tool for understanding HTOL product BIST failures.
Abdullah YassineLauren BlairWayland SeifertPublished in: IRPS (2015)
Keyphrases
- failure rate
- high speed
- tool support
- life cycle
- software reliability
- product quality
- case study
- quality control
- search based software testing
- silicon dioxide
- reliability analysis
- software testing
- production planning
- integrated circuit
- real time
- software tools
- low power
- software engineering
- expert systems
- genetic algorithm
- neural network