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A March Test for Functional Faults in Semiconductor Random Access Memories.

Dong S. SukSudhakar M. Reddy
Published in: IEEE Trans. Computers (1981)
Keyphrases
  • random access
  • disk storage
  • test cases
  • multiview video coding
  • solid state
  • built in self test
  • flash memory
  • multiresolution
  • fault diagnosis
  • memory size
  • main memory
  • fault detection