Universal delay test sets for logic networks.

Uwe Sparmann Holger Müller Sudhakar M. Reddy

Published in: IEEE Trans. Very Large Scale Integr. Syst. (1999)

Keyphrases

test set
error rate
training set
multi valued
social networks
training data
modal logic
test data
evaluation methodology
logic programming
test cases
decision trees
network structure
complex networks
neural network
model selection
network resources
classical logic
random selection