Real-time simulation of thin-film interference with surface thickness variation using the shallow water equations.
Mingyi GuJiajia DaiJiazhou ChenKe YanJing HuangPublished in: Comput. Animat. Virtual Worlds (2024)
Keyphrases
- thin film
- film thickness
- real time
- white light interferometry
- grain size
- mathematical model
- high density
- refractive index
- multi layer
- electron microscopy
- electrical properties
- short circuit
- simulation model
- cross section
- room temperature
- solar cell
- light scattering
- neural network
- surface reconstruction
- high speed
- simulation software
- low cost
- d objects
- surface temperature
- control system
- navier stokes equations