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Is triple modular redundancy suitable for yield improvement?

Julien VialArnaud VirazelAlberto BosioPatrick GirardChristian LandraultSerge Pravossoudovitch
Published in: IET Comput. Digit. Tech. (2009)
Keyphrases
  • data mining
  • information retrieval
  • search engine
  • neural network
  • machine learning
  • computer vision
  • three dimensional
  • bayesian networks
  • support vector
  • computational complexity
  • significant improvement