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Is triple modular redundancy suitable for yield improvement?
Julien Vial
Arnaud Virazel
Alberto Bosio
Patrick Girard
Christian Landrault
Serge Pravossoudovitch
Published in:
IET Comput. Digit. Tech. (2009)
Keyphrases
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data mining
information retrieval
search engine
neural network
machine learning
computer vision
three dimensional
bayesian networks
support vector
computational complexity
significant improvement