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Hot Electron Source Side Injection Comprehension in 40nm eSTM™.

Franck MelulThibault KempfVincenzo Della MarcaMarc BocquetMadjid AkbalFrederique TrenteseauxMarc MantelliArnaud RégnierStephan NielFrancesco La Rosa
Published in: IMW (2021)
Keyphrases
  • metal oxide
  • texture information
  • feature space
  • support vector