Sign in
On-Chip Monitoring for In-Place Diagnosis of Undesired Power Domain Problems in IC Chips.
Makoto Nagata
Daisuke Fujimoto
Noriyuki Miura
Published in:
ATS (2014)
Keyphrases
</>
high speed
integrated circuit
power consumption
high density
expert systems
np complete
monitoring system
chip design
real time
domain specific
decision support
domain experts
normal operation