On-Chip Monitoring for In-Place Diagnosis of Undesired Power Domain Problems in IC Chips.

Makoto Nagata Daisuke Fujimoto Noriyuki Miura

Published in: ATS (2014)

Keyphrases

high speed
integrated circuit
power consumption
high density
expert systems
np complete
monitoring system
chip design
real time
domain specific
decision support
domain experts
normal operation