Intrinsic point defects investigation in InAlAs with extrapolated defect transition level.
Yuxin FangJialin ZhangYongbo SuZhi JinYinghui ZhongPublished in: Microelectron. J. (2024)
Keyphrases
- defect detection
- higher level
- automated visual inspection
- levels of abstraction
- real world
- surface defects
- decision trees
- database systems
- objective function
- expert systems
- low level
- probability distribution
- feature selection
- single image
- machine vision
- lower level
- computer vision
- social networks
- machine learning
- neural network