Reliability and Variability-Aware DTCO Flow: Demonstration of Projections to N3 FinFET and Nanosheet Technologies.

Gerhard Rzepa Markus Karner Oskar Baumgartner Georg Strof Franz Schanovsky Ferdinand Mitterbauer Christian Kernstock Hui-Wen Karner Pieter Weckx Geert Hellings Dieter Claes Zhicheng Wu Yang Xiang Thomas Chiarella Bertrand Parvais Jérôme Mitard Jacopo Franco Ben Kaczer Dimitri Linten Zlatan Stanojevic

Published in: IRPS (2021)

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