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An exploration for the degradation behavior of 2-D electrostatic microscanners by accelerated lifetime test.

Dayong QiaoRong ZhaoYalong ZhangChangfeng XiaXiumin SongQiaoming You
Published in: Microelectron. Reliab. (2018)
Keyphrases
  • life span
  • neural network
  • test data
  • statistical tests
  • learning algorithm
  • website
  • energy consumption
  • real time
  • data mining
  • image processing
  • similarity measure
  • test cases
  • search strategies
  • behavior analysis