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Did We Test Enough? Functional Coverage for Post-Silicon Validation.

Sebastian PointnerRobert Wille
Published in: ITC-Asia (2019)
Keyphrases
  • high speed
  • test suite
  • database systems
  • set of test cases
  • databases
  • image processing
  • case study
  • image segmentation
  • artificial neural networks
  • low cost
  • test cases
  • test data
  • model based testing