Quantifying Defect-Mediated Electron Capture and Emission in Flexible Monolayer WS2 Field-Effect Transistors.
J. A. YangEros ReatoTheresia KnoblochJ.-S. KoZ. ZhangAndrew J. MannixKrishna SaraswatTibor GrasserMax Christian LemmeEric PopPublished in: DRC (2024)