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Improving reliability of weak PUFs via circuit techniques to enhance mismatch.

Vinay C. PatilArunkumar VijayakumarDaniel E. HolcombSandip Kundu
Published in: HOST (2017)
Keyphrases
  • high speed
  • website
  • neural network
  • analog vlsi
  • real time
  • databases
  • computer vision
  • metadata
  • decision trees
  • evolutionary algorithm
  • reliability analysis
  • analog circuits
  • weak signal