Approximation-aware testing for approximate circuits.
Arun ChandrasekharanStephan EggersglüßDaniel GroßeRolf DrechslerPublished in: ASP-DAC (2018)
Keyphrases
- exact computation
- efficient computation
- quality guarantees
- numerical integration
- expectation propagation
- approximation algorithms
- test cases
- error bounds
- asynchronous circuits
- bayes networks
- test set
- graphical models
- database
- circuit design
- probabilistic model
- training set
- optimal solution
- delay insensitive
- logic synthesis
- data sets