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Coverage Driven High-Level Test Generation Using a Polynomial Model of Sequential Circuits.
Bijan Alizadeh
Mohammad Mirzaei
Masahiro Fujita
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2010)
Keyphrases
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high level
conceptual model
low level
test generation
information systems
probabilistic model
high speed
software development
test sequences