TEST: Testing Environment for Embedded Systems Based on TTCN-3 in SILS.
Hochang ChaeXiulin JinSeonghun LeeJeonghun ChoPublished in: FGIT-ASEA (2009)
Keyphrases
- embedded systems
- test suite
- embedded software
- test cases
- computing power
- low cost
- processing power
- regression testing
- test generation
- resource limited
- real time systems
- software testing
- embedded devices
- hardware software
- software systems
- safety critical
- real time image processing
- hw sw
- flash memory
- real time
- field programmable gate array
- protocol stack
- reverse engineering
- signal processing
- software engineering