Login / Signup
Impact of III-V and Ge Devices on Circuit Performance.
Jeongha Park
Saeroonter Oh
Soyoung Kim
H.-S. Philip Wong
S. Simon Wong
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2013)
Keyphrases
</>
mobile devices
high speed
embedded devices
semiconductor devices
neural network
embedded systems
high impact
real time
data mining
information retrieval
genetic algorithm
artificial intelligence
wireless sensor networks
processing capabilities
digital circuits