On macro-fault: a new fault model, its implications on fault tolerance and manufacturing yield.
Tak-Kei LamXing WeiWen-Ben JoneYi DiaoYu-Liang WuPublished in: ACM Great Lakes Symposium on VLSI (2014)
Keyphrases
- fault tolerance
- fault model
- fault tolerant
- fault management
- fault models
- fault injection
- distributed computing
- distributed systems
- load balancing
- high availability
- response time
- peer to peer
- group communication
- replicated databases
- mobile agents
- database replication
- error detection
- model based diagnosis
- computer networks
- data streams