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Physics-informed machine learning to analyze oxide defect-induced RTN in gate leakage current.
Anirudh Varanasi
Robin Degraeve
Philippe J. Roussel
Andrea Vici
Clement Merckling
Published in:
IRPS (2024)
Keyphrases
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leakage current
machine learning
low voltage
silicon dioxide
electrical properties
computer science
power line
artificial intelligence
machine learning algorithms
data mining
pattern recognition
real time
learning algorithm
parallel processing