Login / Signup
Testing Random Defect and Process Variation Induced Comparison Faults of TCAMs With Asymmetric Cells.
Jin-Fu Li
Yu-Jen Huang
Yong-Jyun Hu
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2010)
Keyphrases
</>
incremental updates
training set
high dimensional
query language
nearest neighbor
test cases
fault diagnosis
image content