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Automated four-point probe measurement of nanowires inside a scanning electron microscope.
Changhai Ru
Yong Zhang
Yu Sun
Yu Zhong
Xueliang Sun
David Hoyle
Ian Cotton
Published in:
CASE (2010)
Keyphrases
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scanning electron microscope
neural network
semi automated
data driven
context sensitive
database systems
fully automated
automated analysis
database
real time
real world
bayesian networks
data acquisition
computer aided
single point
measurement data