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An Integrated Framework for At-Speed and ATE-Driven Delay Test of Contract-Manufactured ASICs.

Vikram IyengarKenneth PichamuthuAndrew FerkoFrank WoytowichDavid E. LackeyGary GriseMark TaylorMike DegregorioSteven F. Oakland
Published in: VTS (2007)
Keyphrases
  • high speed
  • multi agent
  • databases
  • data driven
  • test data