Leveraging 3D-IC for on-chip timing uncertainty measurements.

Randy Widialaksono Wenxu Zhao W. Rhett Davis Paul D. Franzon

Published in: 3DIC (2014)

Keyphrases

measurement noise
measurement errors
high speed
low cost
uncertain data
measurement error
high density
analog vlsi
integrated circuit
decision theory
measured data
physical design
noisy measurements
database
vlsi design
energy consumption
artificial intelligence
learning algorithm
data sets