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Memory Mapped I/O Register Test Case Generator for Large Systems-on-Chip.
Roni Hämäläinen
Henri Lunnikivi
Timo Hämäläinen
Published in:
NorCAS (2023)
Keyphrases
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test cases
test case selection
database
artificial intelligence
input output
main memory
black box
set of test cases
learning algorithm
high speed
test data
software testing
external memory
test generation