• search
    search
  • reviewers
    reviewers
  • feeds
    feeds
  • assignments
    assignments
  • settings
  • logout

Memory Mapped I/O Register Test Case Generator for Large Systems-on-Chip.

Roni HämäläinenHenri LunnikiviTimo Hämäläinen
Published in: NorCAS (2023)
Keyphrases
  • test cases
  • test case selection
  • database
  • artificial intelligence
  • input output
  • main memory
  • black box
  • set of test cases
  • learning algorithm
  • high speed
  • test data
  • software testing
  • external memory
  • test generation