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Critical-Path-Aware X-Filling for Effective IR-Drop Reduction in At-Speed Scan Testing.

Xiaoqing WenKohei MiyaseTatsuya SuzukiSeiji KajiharaYuji OhsumiKewal K. Saluja
Published in: DAC (2007)
Keyphrases
  • critical path
  • information retrieval
  • high speed
  • job shop scheduling problem
  • real time
  • genetic algorithm
  • similarity measure
  • information retrieval systems