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Reliability evaluation of combinational logic circuits by symbolic simulation.

Alessandro BoglioloMaurizio DamianiPiero OlivoBruno Riccò
Published in: VTS (1995)
Keyphrases
  • logic circuits
  • low power
  • low cost
  • functional decomposition
  • reliability assessment
  • mathematical model
  • logic synthesis
  • tunnel diode
  • image analysis
  • high speed
  • power dissipation
  • gate array