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Concurrent Testing of Digital Circuits for Advanced Fault Models.

Santosh BiswasSiddhartha MukhopadhyayP. PatraDipankar Sarkar
Published in: DDECS (2006)
Keyphrases
  • digital circuits
  • model based diagnosis
  • fault models
  • fault model
  • data flow
  • functional decomposition
  • dynamic systems
  • finite state machines
  • search algorithm
  • data model
  • model checking
  • horn clauses