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Interconnect delay fault testing with IEEE 1149.1.

Yuejian WuPaul Soong
Published in: ITC (1999)
Keyphrases
  • fault model
  • fault detection
  • power dissipation
  • fault diagnosis
  • high speed
  • test cases
  • fault injection
  • real time embedded systems
  • information retrieval
  • response time
  • wireless communication
  • critical path