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Diagnosis of Performance Limiting Segments in Integrated Circuits Using Path Delay Measurements.
Ahish Mysore Somashekar
Spyros Tragoudas
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2017)
Keyphrases
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integrated circuit
fault diagnosis
model based diagnosis
shortest path
path length
model based reasoning
electron beam
multicast tree
medical diagnosis
endpoints
fault detection
multiple faults
computer aided
measured data
clinically relevant