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A 3-D Rotation-Based Through-Silicon via Redundancy Architecture for Clustering Faults.
Minho Cheong
Ingeol Lee
Sungho Kang
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2020)
Keyphrases
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clustering method
clustering algorithm
management system
k means
real time
fault detection
data clustering
self organizing maps
multiple faults
high speed
low cost
neural network
unsupervised learning
software architecture
data points
outlier detection
hierarchical clustering
fuzzy clustering
categorical data
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