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B-Spline X-Ray Diffraction Imaging - Rapid non-destructive measurement of die warpage in ball grid array packages.

Aidan CowleyAndrej IvankovicC. S. WongN. S. BennettA. N. DanilewskyMarcel GonzalezVladimir ChermanBart VandeveldeIngrid De WolfP. J. McNally
Published in: Microelectron. Reliab. (2016)
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