On Reduction of Deterministic Test Pattern Sets.

Stephan Eggersglüß Sylwester Milewski Janusz Rajski Jerzy Tyszer

Published in: ITC (2021)

Keyphrases

pattern matching
artificial neural networks
special case
test data
machine learning
test cases
pattern discovery
data sets
databases
computer vision
search algorithm
control system
rough set theory
set theoretic
similar patterns