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A new analytical modelling of 10 nm negative capacitance-double gate TFET with improved cross talk and miller effects in digital circuit applications.
Adrija Mukherjee
Papiya Debnath
D. Nirmal
Manash Chanda
Published in:
Microelectron. J. (2023)
Keyphrases
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digital circuits
cmos technology
low power
high speed
positive and negative
model based diagnosis
functional decomposition
circuit design
analog circuits
unit length
leakage current