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IMS Technical Committee TC-3: Condition Monitoring and Fault Diagnosis Instrument.

Weihua LiXuefeng Chen
Published in: IEEE Instrum. Meas. Mag. (2022)
Keyphrases
  • monitoring and fault diagnosis
  • fault diagnosis
  • probabilistic neural networks
  • fault detection
  • real time
  • expert systems
  • artificial neural networks
  • condition monitoring