Defect detection with transient current testing and its potential for deep sub-micron CMOS ICs.

Manoj Sachdev Peter Janssen Victor Zieren

Published in: ITC (1998)

Keyphrases

defect detection
automated visual inspection
future development
image processing
feature extraction
multiscale
textured surfaces
steady state
test cases
wireless sensor networks
preprocessing
databases
database systems
genetic algorithm
information retrieval
machine learning
neural network