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A concurrent BIST scheme for on-line/off-line testing based on a pre-computed test set.
Ioannis Voyiatzis
Dimitris Gizopoulos
Antonis M. Paschalis
Constantin Halatsis
Published in:
ITC (2005)
Keyphrases
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test set
pre computed
test data
error rate
test cases
training set
storage cost
database
evaluation methodology
training data
index tree
training and test sets
class distribution
data cube
multi dimensional
index structure
face images
active learning
learning algorithm
disk space
real world