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Research and Implementation of a High Speed Test Generation for Ultra Large Scale Combinational Circuits.
Zhide Zeng
Jihua Chen
Hefeng Cao
Published in:
Asian Test Symposium (1999)
Keyphrases
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high speed
test generation
ultra large scale
test cases
design automation
low power
test sequences
information systems
open source
circuit design
logic circuits
symbolic execution
data sets
asynchronous circuits
real world
software testing