Characteristic Degradation of Power MOSFETs by X-Ray Irradiation and Their Recovery.

Masato Shiozaki Takashi Sato

Published in: IRPS (2022)

Keyphrases

x ray
electron beam
medical imaging
intraoperative
digital x ray images
three dimensional
x ray images
power consumption
ct scans
tomographic images
electron microscopy
computer tomography
transmission electron microscopy
projection images
low dose
optical imaging
metal oxide
image quality
cone beam
guide wire