Login / Signup
A Framework to Minimize Test Escape and Yield Loss during IDDQ Testing: A Case Study.
Hugo Cheung
Sandeep K. Gupta
Published in:
VTS (2000)
Keyphrases
</>
test cases
case study
main contribution
theoretical framework
statistical tests
neural network
machine learning
learning algorithm
information systems
feature selection
clustering algorithm
image segmentation
lightweight
test suite