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Fast Sequential Circuit Test Generation Using High-Level and Gate-Level Techniques.
Elizabeth M. Rudnick
Roberto Vietti
Akilah Ellis
Fulvio Corno
Paolo Prinetto
Matteo Sonza Reorda
Published in:
DATE (1998)
Keyphrases
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test generation
high level
higher level
low level
lower level
test cases
test sequences
software testing
design automation
symbolic execution
multiple input
high speed
case study
artificial intelligence
static analysis
quality assurance
open source
programming language
databases