Wavelet Analysis of Surface Morphologies of magnetron sputtered al-Cu Thin films.
Gaurav BhatnagarR. JayaganthanBalasubramanian RamanPublished in: Int. J. Wavelets Multiresolution Inf. Process. (2009)
Keyphrases
- wavelet analysis
- thin film
- film thickness
- white light interferometry
- mechanical properties
- multiresolution
- wavelet transform
- factor analysis
- feature detection
- grain size
- high density
- short circuit
- gaussian function
- mexican hat
- surface reconstruction
- low frequency
- multi layer
- basis functions
- computer vision
- range data
- cluster analysis
- subband
- silicon nitride
- preprocessing