Improving post-silicon error detection with topological selection of trace signals.

Binod Kumar Kanad Basu Ankit Jindal Masahiro Fujita Virendra Singh

Published in: VLSI-SoC (2017)

Keyphrases

error detection
error correction
error recovery
data cleansing
error correcting
error control
high speed
fault tolerance
error resilient
fault isolation
artificial intelligence
signal processing
neural network
text classification