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Improving post-silicon error detection with topological selection of trace signals.
Binod Kumar
Kanad Basu
Ankit Jindal
Masahiro Fujita
Virendra Singh
Published in:
VLSI-SoC (2017)
Keyphrases
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error detection
error correction
error recovery
data cleansing
error correcting
error control
high speed
fault tolerance
error resilient
fault isolation
artificial intelligence
signal processing
neural network
text classification