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Testing Static and Dynamic Faults in Random Access Memories.

Said HamdiouiZaid Al-ArsAd J. van de Goor
Published in: VTS (2002)
Keyphrases
  • random access
  • test cases
  • fault model
  • solid state
  • fault diagnosis
  • multiview video coding
  • memory size
  • disk storage
  • lower bound
  • flash memory