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On the understanding of cathode related trapping effects in GaN-on-Si Schottky diodes.

William VandendaeleThomas LorinRomain GwozieckiYannick BainesJérome BiscarratMarie-Anne JaudCharlotte GillotMatthew CharlesMarc PlissonnierGilles Reimbold
Published in: ESSDERC (2017)
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