Window for better reliability of nitride heterostructure field effect transistors.
Arvydas MatulionisJuozapas LiberisEmilis SermuksnisLinas ArdaraviciusArtur SimukovicCemil KayisCongyong ZhuRomualdo FerreyraVitaliy AvrutinÜmit ÖzgürHadis MorkoçPublished in: Microelectron. Reliab. (2012)