Login / Signup

Testing of high-speed DACs using PRBS generation with "Alternate-Bit-Tapping".

Mohit SinghMahendra SakareShalabh Gupta
Published in: DATE (2011)
Keyphrases
  • high speed
  • low power
  • real time
  • test cases
  • shift register
  • generation process
  • neural network
  • hidden markov models
  • software engineering
  • test generation
  • physical layer