A test circuit based on a ring oscillator array for statistical characterization of Plasma-Induced Damage.
Won Ho ChoiSaroj SatapathyJohn KeaneChris H. KimPublished in: CICC (2014)
Keyphrases
- statistical tests
- statistical analysis
- post hoc
- statistical significance
- differential equations
- scanning electron microscope
- real time
- electronic circuits
- analog circuits
- feedback loop
- statistical approaches
- high density
- statistical methods
- information theoretic
- statistical models
- test data
- statistically significant
- evolutionary algorithm