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Comparison of different test strategies on a mixed-signal circuit.

Juraj BrenkusViera StopjakováRonny VanhoorenAnton Chichkov
Published in: DDECS (2009)
Keyphrases
  • mixed signal
  • vlsi circuits
  • low power
  • multi channel
  • digital circuits
  • test cases
  • cmos technology
  • image processing
  • high speed
  • case study
  • image sequences
  • circuit design