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Fabrication of a probe-lens device for scanning super-resolution imaging platform.

Boliang JiaSam Hok Sum LaiFeifei WangLianqing LiuGuanglie ZhangWen Jung Li
Published in: NEMS (2017)
Keyphrases
  • semiconductor devices
  • scanning devices
  • high density
  • real time
  • low cost
  • high speed
  • structured light
  • neural network
  • mobile phone
  • platform independent
  • electron beam
  • field effect transistors