Login / Signup

Multiple Fault Testing of Logic Resources of SRAM-Based FPGAs.

Saurabh GoyalMihir R. ChoudhuryS. S. S. P. RaoL. Kalyan Kumar
Published in: VLSI Design (2005)
Keyphrases
  • image processing
  • logic programming
  • resource management
  • fault diagnosis
  • resource allocation
  • data sets
  • fault detection
  • resource constraints
  • software testing
  • fault model